3D Atomprobe-Tomography (3DAPT)

Task: Determination of elements distribution within the small volume of sample and quantification of composition. Specific information on the method: Analyzed volume is 1003 nm3 or slightly bigger Localization precision of atoms down to 1 nm Lowest detectable...

Auriga TM Crossbeam Basissystem
+ EDAX TEAM Pegasus

Task/Objective: TEM Sample Preparation (FIB-lamellas). Atomprobe Sample Preparation. EDS/EBSD Analysis (2D and 3D). Specific information on the methode: Resolution SEM:               1,9nm/1kV; 1,0nm/15kV Resolution FIB:                  2,5nm/30kV (lateral) EDS...

ZEISS Merlin® FE-SEM

Task/Objective: SEM imaging of materials and micro-devices. Element analysis (mapping). Specific information on the method: Resolution SEM:               0.8 nm @ 15 kV, 1.4 nm @ 1 kV Acceleration Voltage: 0,02 – 30kV Magnification:...

HORIBA LabRam Evolution HR

Task: High resolution imaging of conductive and uncoated insulating sample surfaces, as well as high resolution materials modification and milling of nanostructures.   Specific information on the method: Lateral resolution: better than 0.4 nm (Helium, edge...

Röntgendiffraktionssystem D8 Discover (XRD)

Task/Objective: Analyzing of phase, structure and/or orientation of powder, films, layer architectures and bulk materials. Specific information on the equipment/instrumentation: usable angular range 2q between 0 and 169° (depending on accessories) Accuracy ± 0.005°...