von admin | Nov 18, 2015 | Methods
Task: Determination of elements distribution within the small volume of sample and quantification of composition. Specific information on the method: Analyzed volume is 1003 nm3 or slightly bigger Localization precision of atoms down to 1 nm Lowest detectable...
von admin | Nov 18, 2015 | Methods
Task/Objective: TEM Sample Preparation (FIB-lamellas). Atomprobe Sample Preparation. EDS/EBSD Analysis (2D and 3D). Specific information on the methode: Resolution SEM: 1,9nm/1kV; 1,0nm/15kV Resolution FIB: 2,5nm/30kV (lateral) EDS...
von admin | Nov 18, 2015 | Methods
Task/Objective: SEM imaging of materials and micro-devices. Element analysis (mapping). Specific information on the method: Resolution SEM: 0.8 nm @ 15 kV, 1.4 nm @ 1 kV Acceleration Voltage: 0,02 – 30kV Magnification:...
von admin | Nov 18, 2015 | Methods
Task: High resolution imaging of conductive and uncoated insulating sample surfaces, as well as high resolution materials modification and milling of nanostructures. Specific information on the method: Lateral resolution: better than 0.4 nm (Helium, edge...
von admin | Nov 18, 2015 | Methods
Task/Objective: Analyzing of phase, structure and/or orientation of powder, films, layer architectures and bulk materials. Specific information on the equipment/instrumentation: usable angular range 2q between 0 and 169° (depending on accessories) Accuracy ± 0.005°...
von admin | Nov 18, 2015 | Methods
Task/Objective: Characterization of mechanical fracture by impact test of materials at cryogenic temperature. Specific information on the equipment/instrumentation: Maximum energy : 450 J Impact test via Charpy impact or drop weight Temperature range: 292 K – 77 K...
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